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There is a growing demand for portable metrology solutions that offer flexibility, accessibility, and ease of use. Portable devices, such as handheld 3D scanners, portable CMMs, and laser trackers, enable manufacturers to perform measurements directly on the shop floor, eliminating the need for transporting large and bulky parts to dedicated metrology labs. This trend is influenced by factors such as the rise of agile manufacturing practices, the need for real-time quality assurance, and the desire for cost-effective metrology solutions that can adapt to dynamic production environments. The development of 3D measurement solutions, portable CMM, robot-mounted optical CMM scanners, cloud-based software application platforms, and dimensional metrology services has led to substantial growth in the market. For instance, in October 2021, ZEISS acquired Capture 3D, a prominent GOM 3D non-contact measuring solutions provider based in the U.S. Capture 3D delivers 3D measurement solutions to help customers significantly improve product design, manufacturing, quality control, and production processes.
Industrial metrology is increasingly being integrated with digital manufacturing technologies such as Industry 4.0, the Internet of Things (IoT), and digital twins. By leveraging sensor data, connectivity, and analytics, manufacturers can gain deeper insights into their production processes and product quality. Metrology data can be seamlessly integrated with digital twins of manufacturing assets, enabling predictive maintenance, process optimization, and virtual simulation of production scenarios. This trend reflects a broader shift toward data-driven decision-making and smart manufacturing initiatives aimed at improving efficiency, agility, and competitiveness across the manufacturing value chain. The growing adoption of IoT-enabled sensors across the manufacturing value chain also brings advancements in the measuring process. In 2021, the Institute for Laser Technologies in Medicine and Metrology (ILM) at the University of Ulm developed a special sensor for short measurement times and environmental influences. Multi-wavelength digital holography, along with its associated implementation, enables the collection of topographic data across an entire area for both diffuse and specular reflective surfaces within a single image.